From: Veeco Instruments [Veecomi@veeco.com]
Sent: Monday, August 16, 2010 8:18 AM
To: Milka Pejovic
Subject: Visit your atomic force microscopy partner at ACS in Boston
MultiMode 8 Scanning Probe Microscope

Veeco Instruments will be exhibiting at

Booth #125 at the upcoming ACS Meeting in Boston, August 22-26, 2010

Here's an inside look at what we'll be displaying in our booth.

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ARE YOU GETTING THE MOST OUT OF YOUR SCANNING PROBE MICROSCOPE?

If you're planning to attend the American Chemical Socety Fall 2010 National Meeting & Exposition, stop by our booth to see how the MultiMode 8® Scanning Probe Microscope (SPM) enables high-performance nanoscale research in life sciences by:

• Revealing details not seen with TappingMode using ScanAsyst™ mode

• Controling imaging force at lower levels than TappingMode to protect samples and tips with ScanAsyst

• Using automatic image optimization to achieve top-quality results with ScanAsyst

• Performing quantitative nanoscale mapping of material properties with PeakForce QNM™

Polymer brush
sample imaged with the MultiMode 8

Polymer brush sample imaged with the
MultiMode 8 (ScanAsyst)


SIGN UP FOR OUR FREE AFM WEBINAR SERIES

Our webinar presenters discuss the latest in Atomic Force Microscopy technology, techniques and research. The monthly webinars typically last ~1 hour and include a live interactive Q&A session.

Join the Nanoscale World Community Webinar Group to get all the latest schedule updates and invitations as well as access, download, reference and view recorded media from previous webinars - whenever and wherever you want.

Share Ideas - The Nanoscale World Community

Download the slides and watch the recorded broadcast from our latest AFM webinar - The need for 3D Surface Characterization in Photovoltaic Solar Cell Manufacturing.

WIN FREE AFM PROBES!

Win Free Veeco Probes

Stop by the Veeco booth (#125) at the ACS Fall 2010 National Meeting & Exposition and enter our drawing to win one pack of 10 probes.

www.veecoprobes.com


COMPLIMENTARY VEECO WORKSHOP

New SPM Techniques for Materials & Energy Research

Monday, August 23, 3:30–6:00PM

Room 102B – Boston Convention & Exhibition Center

Registration recommended at www.acs.org/boston2010


FREE EXPO PASS

Register for your free pass to the ACS Expo area

Get Details and Register Here


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YOUR PARTNER IN ATOMIC FORCE MICROSCOPY

See our AFM solutions to all your metrology needs:

www.veeco.com/AFM

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