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Veeco
Instruments will be exhibiting at
Booth
#125 at the upcoming ACS Meeting in Boston, August 22-26,
2010
Here's
an inside look at what we'll be displaying in our
booth.
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this message online if you can't see it properly. To
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ARE
YOU GETTING THE MOST OUT OF YOUR SCANNING PROBE
MICROSCOPE?
If
you're planning to attend the American Chemical Socety Fall 2010 National
Meeting & Exposition, stop by our booth to see how the
MultiMode 8® Scanning Probe Microscope
(SPM) enables high-performance nanoscale research
in life sciences by:
•
Revealing details not seen with TappingMode using ScanAsyst™ mode
•
Controling imaging force at lower levels than TappingMode to
protect samples and tips with ScanAsyst
•
Using automatic image optimization to achieve top-quality
results with ScanAsyst
•
Performing quantitative nanoscale mapping of material
properties with PeakForce QNM™

Polymer
brush sample imaged with the MultiMode 8
(ScanAsyst)
SIGN
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Download
the slides and watch the recorded broadcast from our latest
AFM webinar - The need for 3D Surface Characterization
in Photovoltaic Solar Cell Manufacturing. |
WIN
FREE AFM PROBES!

Stop
by the Veeco booth (#125) at the ACS Fall 2010 National
Meeting & Exposition and enter our drawing to win
one pack of 10 probes.
www.veecoprobes.com
COMPLIMENTARY
VEECO WORKSHOP
New
SPM Techniques for Materials & Energy
Research
Monday,
August 23, 3:30–6:00PM
Room
102B – Boston Convention & Exhibition Center
Registration
recommended at www.acs.org/boston2010
FREE
EXPO PASS
Register
for your free pass to the ACS Expo area
Get Details and Register
Here
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